5

Modeling early failure in integrated circuit interconnect

Year:
2000
Language:
english
File:
PDF, 129 KB
english, 2000
18

Social exchange: Empirical examination of form and focus

Year:
2011
Language:
english
File:
PDF, 596 KB
english, 2011
43

Device Performance of Silicon Nanotube Field Effect Transistor

Year:
2014
Language:
english
File:
PDF, 741 KB
english, 2014
49

Dislocation pinning/depinning transition: Fixed-point analysis

Year:
2000
Language:
english
File:
PDF, 73 KB
english, 2000